The transmission electron microscope is the most powerful imaging tool in materials science as it allows to directly observe the internal structure of the analyzed material down to the atomic scale. Identification of chemical elements as well as their distribution is performed with sub-nanometer resolution as point analysis, linear scans or 2D mappings using spectroscopy tools.
- Accelerating voltage: 60-200 keV
- High brightness X-FEG gun, point resolution ~ 1.36 Å
- STEM with HAADF detector
- In-column SUPER-EDX 4 sector detector
Conventional TEM imaging: BF & DF
In Bright-field (BF) conventional TEM the image of the sample is formed with the direct beam. In Dark-field (DF) microscopy, the direct beam is excluded.
Atomic resolution TEM imaging: HRTEM
High-resolution transmission electron microscopy (HRTEM) is an imaging mode that allows to visualize the crystalline structure of a sample at atomic scale.
STEM imaging: HAADF
In the STEM mode the HAADF detector, also called the Z-contrast detector generates an image reflecting the qualitative element distribution in the sample: the higher the atomic number of the element present, the brighter the contrast of the respective area.
TEM Spectrosocpy: super-fast EDX mapping
The super-fast EDX with a 4 sector in-column detector enables to perform mappings within minutes instead of hour as the count number is in the range of kcps.